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Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing

12 days ago
https://arxiv.org/abs/2508.01786
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  • #Computer Science
  • #Silent Data Corruption
  • #Hardware Architecture
  • Too many defective compute chips are escaping manufacturing tests, exceeding industrial targets by at least 10x.
  • Silent data corruptions (SDCs) from test escapes threaten reliable computing.
  • A three-pronged approach is proposed: quick diagnosis of defective chips from system-level behaviors, in-field detection, and new test experiments.
  • New test experiments must address drawbacks of previous industrial tests and case studies.
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